Publications

Transient and instantaneous third-order nonlinear optical response of C60 and the higher fullerenes C70, C76 and C84

E Koudoumas, M Konstantaki, A Mavromanolakis, X Michaut, S Couris, S Leach

At. Mol. Opt. Phys., 34, 4983, 2001, https://doi.org/10.1088/0953-4075/34/24/302

Few-photon quantum electrodynamics in a structured continuum

G. M. Nikolopoulos, P. Lambropoulos

J. Opt. B: Quantum Semiclass. Opt., 3, 115, 2001, doi.org/10.1088/1464-4266/3/3/308

Laser-Induced Breakdown Spectroscopy in Art and Archaeology

D. Anglos

Applied Spectroscopy , 55, 186A-205A , 2001, doi.org/10.1366/0003702011952398

Holographic interferometry for the structrural diagnostics of UV laser ablation of polymer substrates

A. Bonarou, L. Antonucci, V. Tornari, S. Georgiou, C. Fotakis

Applied Physics A , 73, 5, 647-651, 2001, doi.org/10.1007/s003390101004

Chemical bonding and nanomechanical studies of carbon nitride films synthesized by reactive pulsed laser deposition

P. Papakonstantinou, D.A. Zeze, A. Klini, J. McLaughlin

Diam. Relat. Mater. , 10, 1109, 2001, 10.1016/S0925-9635(00)00498-2

Ultrafast nonlinear optical response of C60–polystyrene star polymers

E. Koudoumas, M. Konstantaki, A. Mavromanolakis, S. Courisa, Y. Ederle, C. Mathis, P. Setac, S. Leach

Chem. Phys. Lett., 335, 5-6, 533-538, 2001, https://doi.org/10.1016/S0009-2614(01)00088-4

Slice imaging: A new approach to ion imaging and velocity mapping

C.R. Gebhardt, T.P. Rakitzis, P.C. Samartzis, V. Ladopoulos, T.N. Kitsopoulos

Rev. Sci. Instrum. , 72, 10, 3848, 2001, doi.org/10.1063/1.1403010

Laser printing of active optical microstructures

G. Koundourakis, C. Rockstuhl, D. Papazoglou, A. Klini, I. Zergioti, N.A. Vainos, C. Fotakis

Appl. Phys. Lett. , 78, 853, 2001, 10.1063/1.1348321

Beyond single-photon localization at the edge of a photonic band gap

G. M. Nikolopoulos, P. Lambropoulos

Phys. Rev. A, 61, 053812, 2000, doi.org/10.1103/PhysRevA.61.053812

Modern technology in artwork conservation: a laser-based approach for process control and evaluation

V. Tornari, V. Zafiropulos, A. Bonarou, N.A. Vainos, C. Fotakis

J. Opt. and Lasers in Engineering , 34 , 309-326 , 2000, dx.doi.org/10.1016/S0143-8166(00)00068-3

Pages