Publications

Role of laser pulse duration and gas pressure in deposition of AlN thin films

E. Gyorgy, C. Ristoscu, I. Michailescu, A. Klini, N. Vainos, C. Fotakis, C. Ghica, G. Schmerber, J. Faerber

J. Appl. Phys. , 90, 456, 2001, 10.1063/1.1376417

Transient and instantaneous third-order nonlinear optical response of C60 and the higher fullerenes C70, C76 and C84

E Koudoumas, M Konstantaki, A Mavromanolakis, X Michaut, S Couris, S Leach

At. Mol. Opt. Phys., 34, 4983, 2001, https://doi.org/10.1088/0953-4075/34/24/302

Few-photon quantum electrodynamics in a structured continuum

G. M. Nikolopoulos, P. Lambropoulos

J. Opt. B: Quantum Semiclass. Opt., 3, 115, 2001, doi.org/10.1088/1464-4266/3/3/308

Laser-Induced Breakdown Spectroscopy in Art and Archaeology

D. Anglos

Applied Spectroscopy , 55, 186A-205A , 2001, doi.org/10.1366/0003702011952398

Holographic interferometry for the structrural diagnostics of UV laser ablation of polymer substrates

A. Bonarou, L. Antonucci, V. Tornari, S. Georgiou, C. Fotakis

Applied Physics A , 73, 5, 647-651, 2001, doi.org/10.1007/s003390101004

Chemical bonding and nanomechanical studies of carbon nitride films synthesized by reactive pulsed laser deposition

P. Papakonstantinou, D.A. Zeze, A. Klini, J. McLaughlin

Diam. Relat. Mater. , 10, 1109, 2001, 10.1016/S0925-9635(00)00498-2

Ultrafast nonlinear optical response of C60–polystyrene star polymers

E. Koudoumas, M. Konstantaki, A. Mavromanolakis, S. Courisa, Y. Ederle, C. Mathis, P. Setac, S. Leach

Chem. Phys. Lett., 335, 5-6, 533-538, 2001, https://doi.org/10.1016/S0009-2614(01)00088-4

Slice imaging: A new approach to ion imaging and velocity mapping

C.R. Gebhardt, T.P. Rakitzis, P.C. Samartzis, V. Ladopoulos, T.N. Kitsopoulos

Rev. Sci. Instrum. , 72, 10, 3848, 2001, doi.org/10.1063/1.1403010

Beyond single-photon localization at the edge of a photonic band gap

G. M. Nikolopoulos, P. Lambropoulos

Phys. Rev. A, 61, 053812, 2000, doi.org/10.1103/PhysRevA.61.053812

Modern technology in artwork conservation: a laser-based approach for process control and evaluation

V. Tornari, V. Zafiropulos, A. Bonarou, N.A. Vainos, C. Fotakis

J. Opt. and Lasers in Engineering , 34 , 309-326 , 2000, dx.doi.org/10.1016/S0143-8166(00)00068-3

Pages